The production of semiconductor lasers on silicon wafers has long been the target of the electronics industry, but the manufacturing process has proved extremely challenging. Now, researchers at A * STAR Research Institute have developed a new manufacturing method that is cheap, simple and scalable. Hybrid silicon lasers combine the luminescent properties of III-V semiconductors such as gallium arsenide and indium phosphide with proven silicon fabrication techniques. These lasers have received considerable attention as they can integrate photonic and microelectronic components into a single silicon chip for inexpensive, mass-produced optics. They have a wide range of applications, from short-range data communications to high-speed, long-distance optical transmission. However, in the current production process, lasers were fabricated on separate III-V semiconductor wafers and then individually aligned to each silicon device - a time-consuming and expensive process that limited the number of lasers on the chip. To overcome these limitations, Doris Keh-Ting Ng from A * STAR Data Storage Institute and colleagues developed an innovative method for producing mixed III-V semiconductor and silicon on insulator (SOI) optical microcavities. This greatly reduces the complexity of the manufacturing process and makes the device structure more compact. Bevel Scanning Electron Microscopy Image of a 500 nm Diameter Microdisc. Image courtesy of A * STAR Data Storage Institute "Etching the entire cavity is very challenging," Ng said. "At the moment, there is not a single etch recipe and mask that allows etching across the microcavity, so we decided to develop a new method." The III-V semiconductor films are first attached to a silicon oxide (SiO 2) wafer by first using an SOI interlayer thermal bonding process which results in a strong bond that eliminates the need for oxidizing agents such as piranha etchant or hydrofluoric acid . And by etching into the microcavities of the desired layer using dual hard mask technology, they eliminate the need to use multiple overlay lithography and etch cycles - a challenging process. Ng explains: "Our approach reduces the number of manufacturing steps, reduces the use of hazardous chemicals, and the process requires only one lithography step." For the first time, this work introduced a new heterogeneous nuclear configuration and integrated fabrication process that combines a low-temperature SiO2 interlayer bond with a dual hard mask, single lithography pattern. Ng said: "This process can not only produce heterogeneous nuclear devices, but also greatly reduce the manufacturing process is difficult, and can be used as another hybrid micro-cavity research."